Case Study on Crosstalk Failure Analysis of Advanced Mixed-signal Devices

This paper deals with crosstalk failure analysis induced by metal bridge of advanced mix-signal devices functional test. Two kinds of failure mode were studied in this paper, one is SRAM (Static Radom Access Memory) BIST (Build-in Self Test) fail, the other one is DAC (Digital to Analog Converter) fail. In both cases, the failure mode of the reject sample is just external appearance, which was induced by the real crosstalk failure, which was buried deeply in the behind. Associated with the mechanism assumption and deeply layout and schematic study, the electrical isolation was successfully finished and the root cause identified.