Brightness temperature radiation imaging simulation based on fast ray tracing method

The traditional brightness temperature tracing method requires large tests of intersected surfaces to meet the requirements of the high-precision image. This will result in a large computational complexity for a complex environment scene. To solve the above problems, space meshing ray tracing method is employed in this paper. The improved method avoids a large amount of determination for whether lines and patches are intersecting, reduces the computational quantity and store space, and improve the efficiency and precision of brightness temperature radiation imaging. By establishing the microwave radiation imaging model for a three-dimensional (3D) virtual architectural scene, the result verifies the correctness and the effectiveness of the space meshing brightness temperature tracing method.