An efficient algorithm to design convolved LFSR/SR

We present an efficient algorithm to design convolved LFSR/SRs (linear feedback shift register/shift registers). Convolved LFSR/SR is considered to be the most efficient pseudoexhaustive test pattern generator as far as the lengths of test set and hardware overhead are concerned. We present an efficient search algorithm to assign the residues to the inputs of the circuit under test (CUT) so as to increase the number of potential solutions and thus reduce the hardware overhead. The experimental results indicate the efficiency of the approach.