An experiment study on AC conductivity of conductive ink film at microwave X-band

Utilizing the transmission /reflection measurement method, we investigated the complex conductivity of conductive ink films at microwave X-band. The results show that the frequency dependence of the complex conductivity is in good agreement with the Drude model. However, the retrieved plasmon frequency ω_p and the collision frequency ω_τ are much lower than those of metal materials. The effect of surface morphology of the films on complex conductivity was investigated. The study provides a solid foundation for the applications of conductive ink films, such as wideband absorber designs.