Development of automated measurement systems for testing integrated circuits of switching converters

The paper addresses the development of automated measurement systems for testing integrated circuits of switching voltage converters. Describes an example implementation of test equipment, which used behavioral model of the switching converter under test to minimize the volume using in the process of testing the preparatory information. The tester consists of a real-time controller by National Instruments based on PXIe platform, commutator device and adapter device. The tester provides measurement of a number of static and dynamic parameters in several sub-bands, as well as control of external devices (probes of bed-of-nails system, sorter). Also the example of implementing a behavioral model of the switching voltage converter LM2576 by Texas Instruments. The behavioral model consists of electrical and thermal parts. The basic structure of the specified behavioral patterns is considered. Diagrams of simulation results of the startup and load transient for 3A and 500mA load current is given. The result of the influence of the temperature is displayed in the drawn graph of the output voltage of the power transistor key.