A free space technique for dielectrics and building materials characterization for future 5G applications

In this paper, a simple and fast time domain technique is proposed to determine simultaneously the complex permittivity and thickness of the material under test (MUT) for future 5G applications. The proposed free space time domain technique is calibration independent, noninvasive and uses only the magnitude of power corresponding to the reflected multiple signals from the MUT. The method is validated experimentally for various samples under different background materials and the error in the extracted permittivity and thickness is found less than 5%.