SET response of FinFET-based majority voter circuits under work-function fluctuation

This work evaluates the SET response of FinFET-based Majority Voter circuits under the process-variability impact of metal-gate Work-Function Fluctuation (WFF). Results show that SET pulsewidth is expected to increase under WFF effects. Moreover, results show that the relative standard deviation of the SET pulses can increase from 50% up to 80% according to the adopted transistor sizing.