A new method for SSD black-box performance test

In the past decade, NAND Flash has stood out from numerous non-volatile storage mediums. The NAND Flash based Solid State Disk (SSD) has been widely used in many storing required fields such as embedded applications and data center. A new and efficient SSD black-box performance test method is revising in this paper. The designed test system contains time parameter getter, excitation signal generator, buffer unit, write/read controller and SSD. With the application of the proposed method, not only the influence of TRIM mechanism could been analyzed, but also the test precision is increased significantly. To verify the validity and performance of our test system, the IOPS, response time and write/read bandwidth of the universal testing software (IOMETER, HDTUNE, etc.) and SATA protocol analyzer are presented and compared with our method in detail.