New scan design of asynchronous sequential circuits | IEEE Conference Publication | IEEE Xplore

New scan design of asynchronous sequential circuits


Abstract:

In this paper a new scan design for detection of stuck-at faults and delay faults in asynchronous sequential circuits based on the micropipeline approach is proposed. Thi...Show More

Abstract:

In this paper a new scan design for detection of stuck-at faults and delay faults in asynchronous sequential circuits based on the micropipeline approach is proposed. This new scan methodology can gain the high fault coverage of path delay fault as well as stuck-at fault with the small area overhead in the asynchronous micropipeline environments and easily expand the application such as built-in self testing.
Date of Conference: 23-25 August 1999
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-7803-5705-1
Conference Location: Seoul, Korea (South)

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