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Design for strong testability of RTL data paths to provide complete fault efficiency | IEEE Conference Publication | IEEE Xplore

Design for strong testability of RTL data paths to provide complete fault efficiency


Abstract:

In this paper, we propose a DFT method for RTL data paths to achieve 100% fault efficiency. The DFT method is based on hierarchical test and usage of a combinational ATPG...Show More

Abstract:

In this paper, we propose a DFT method for RTL data paths to achieve 100% fault efficiency. The DFT method is based on hierarchical test and usage of a combinational ATPG tool. The DFT method requires lower hardware overhead and shorter test generation time than the full scan method, and also improves test application time drastically compared with the full scan method.
Date of Conference: 03-07 January 2000
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-7695-0487-6
Print ISSN: 1063-9667
Conference Location: Calcutta, India

References

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