A SET-hardened phase-locked loop

A single-event-transient-hardened-by-design (SET-HBD) charge pump (CP) is proposed to improve the reliability of the phase-locked loop (PLL) in SMIC 0.18μm CMOS process. And, the SET-HBD PLL is designed by adopting the proposed SET-HBD CP instead of the traditional CP. Simulation results show that the designed SET-HBD PLL, which is compared with the general PLL (GPLL), has better performances including lower perturbation ΔV
_ctrl
of the control voltage V
_ctri
, faster recovery time of the locked PLL and smaller maximum-phase displacement of the feedback clock.