Testing of single event effect on several commercial chips of optical transceivers based on heavy ions and pulse laser methods

Single event effect susceptibility of industrial MCUs and key drive chips of several commercial transceivers are studied based on heavy ions and pulse laser methods. Based on the testing results, the performance of receive chips are better than transmit chips or transceiver chips, and the threshold values of transmit chips or transceiver chips are between 30 and 37MeV.cm²/mg. However, the MCUs are very sensitive to single event effect, and the threshold value of SEL is lower than 12.6 MeV.cm²/mg. And finally, we provided two aspects of hardware and software to improve reliability for optical transceivers, which can be referenced by satellite system designation for various space missions.