Modelling and simulation of trap densities in organic thin films

Trapping and de-trapping mechanisms play an important role on the performance of organic based devices, hence it is imperative to have a better understanding of such effects both from experimental and theoretical perspectives. We present a simulation model based on resistor networks to investigate the effect of these traps on the output currents in terms of their spatial distributions. Resistor networks are manipulated accordingly on a sub-micron scale to mimic spot illumination from a light source which triggers de-trapping of carriers leading to a change in the current evaluated.