Noise analysis of differential wideband millimeter-wave power harvester implemented in 65-nm bulk CMOS process

This paper experimentally analyses and highlights the origin of spurious noise of differential millimeter-wave rectifier. The measurement results reveal that the RF signal leakage into the rectifier's dc output node due to lower isolation at millimeter-wave frequencies, and the transistors' flicker noise, as well as the shot noise are the main noise source in the rectified voltage. Furthermore, layout optimization and low-power voltage regulator greatly reduce spurious noise in the rectified voltage and render the rectifier a viable voltage power supply.