A De-embedding application for EMC attenuation measurements of components

The utilization of the de-embedding method for Electromagnetic Compatibility (EMC) component measurements in automotive applications presents a practicable solution approach for improved attenuation measurement results of the device under test (DUT). The attenuation of a component prevents the passing on of conducted emissions inside the car from the mostly screened high-voltage level to the unshielded low-voltage level. The goal is the definition of component properties without the influence of the measurement setup. The measurement setup needs to be subtracted out of the total test fixture to get more reliable results for the DUT. The application of the de-embedding method is shown for attenuation measurements with a known attenuator and discrete components in the measurement setup to be exemplary for active state high-voltage components and Line Impedance Stabilization Networks (LISNs) in automotive industry. The LISNs are used for EMC measurements, because of the active state measurements of high-voltage components. The simplified test setup with a known passive component is used to isolate and analyze the influence of the measurement setup with LISNs. Validations of the de-embedding method and de-embedding results as well as corresponding simulation results are presented for the generic DUT.