Signal toggling in EOFM/EOP application as a novel bulk localization technique for analog devices failure localization

In this paper, a novel signal toggling technique in Electrical Optical Frequency Mapping/ Phase Mapping (EOFM/EOPM) and Electrical Optical probing (EOF) are performed to successfully localized the fault location and identify the physical defect promptly. A function square wave is asserted into the pin of interest, i.e. leakage pin or the function power pin, for EOFM and EOF purposes. This technique help to keep the cost of analysis down and improve the through-put time of the analysis as the technology of the wafer fab is shrinking. The initial technique evaluation was performed on the analog devices in advanced SOI-based circuits and the technique was successfully fan-in to digital CMOS device. Three case studies presented in this papers will demonstrate how the signal toggling in EOFM/EOF help to isolate to defect region.