A compliance current circuit with nanosecond response time for ReRAM characterization

In this study, we propose an ultra-fast compliance current circuit for ReRAM electrical characterization. The circuit utilizes high speed components with low propagation delay and can reduce the overall response time to nanosecond level. Both simulated and measured results demonstrate that our proposed compliance current circuit possesses response time of ~100ns, and thus can effectively reduce the hard breakdown possibility under the large compliance setting during the ReRAM characterization process.