Optimizing Monitor Code Based on Patterns in Runtime Verification

For runtime verification techniques, the most important part that limits its usage is how to reduce the influence of monitors. An important indicator is the amount of software codes after monitor instrumentation. The application of RV is hindered from the size-explosion problem of monitor construction. Namely, the state number of the monitor obtained is doubly exponential in the size of the input specification. This paper puts forward the method of processing parametric properties by utilizing monitor patterns and taking usage of arrays or functions, thereby greatly reducing the amount of monitor codes of the target system. It can improve the application of RV techniques in resource limited and safety critical systems, such as embedded control systems in transport or aerospace areas. Finally, the validity of the method is verified by constructing specific Benchmarks.