Electrical and optical characterization of thermally deposited indium-tin-oxide film on high efficiency single-junction GaAs solar cell

The thermally deposited indium-tin-oxide (ITO) film on single-junction GaAs solar-cell as an excellent antireflection, passivation and window layer to achieve higher efficiency is demonstrated. The passivated characteristic of the ITO-film on GaAs solar-cell is examined by saturation-current and ideality factor. The antireflection of the ITO-film on GaAs solar-cell is revealed by optical-reflectance and external quantum-efficiency. The efficiency of 23.52% for the GaAs cell with ITO antireflection-coating (ARC) was higher than that of 21.92% for the GaAs cell with SiO
₂
ARC.