Non-invasive multilayer dielectric material thickness measurement using V band millimeter wave radar

Non-invasive and accurate thickness estimation of a multilayer dielectric/composite material is vital in different practical applications. Therefore, in this paper an effective methodology for measuring the thickness of different dielectric layers in a multilayer distant target has been proposed based on windowing technique and ingeniously designed V band millimeter wave (MMW) radar. The experimentally estimated thickness found was in close agreement with that of actual thicknesses of different 2-layer and 3-layer sample targets. The limiting capability for correct thickness measurement depends on radar range resolution and hence on the effective bandwidth of the system.