Metallized film capacitors degradation under high electrodynamic load

Degradation process of metallized film capacitors under high electrodynamic load was investigated. Pulse current overload factor exceeded 40. The polar effect of contact edges destruction was found. The average lifetime of different metallized film capacitors in pulse mode was evaluated. Dielectric frequency response testing during a capacitor's degradation was performed. Obtained spectra contain a loss peaks in a range of 1-100 kHz which move to lower frequencies region along with increasing of current pulse number. Possible reasons of such behavior are discussed.