Recent advances in integrated circuit immunity to radio-frequency interference

In recent years, the electromagnetic compatibility (EMC) of integrated circuits (ICs) has been addressed by the scientific and industrial community to measure and model parasitic emissions, as well as susceptibility to radio-frequency interference, in order to compare, predict, and improve the EMC performance of components. The EMC community has made significant progresses on the emission aspects, with the release of mature standards, models, tools, and guidelines. However, the immunity of ICs is still under extensive research. The goal of this paper is to highlight the most-recent advances in immunity measurement, modeling at the integrated-circuit level, and to highlight research publications giving design guidelines for improved immunity. The visions of the standardization committee on the immunity-measurement methods and modeling approaches are also detailed.