New model for stress tests without failures

In this paper, we review several state of the art reliability models that deal with stress tests when no failures occur. We discuss their advantages and shortcomings. We introduce a new model for stress tests with no failures that add further expert information to the stress tests. This is done in a very simple and tangible way. At the subsequent simulation we see the efficiency of our new model compared to the state of the art models. The work has been performed in the project eRamp (Grant Agreement No. 621270), co-funded by grants from Austria, Germany, Slovakia and the ENIAC Joint Undertaking.