Local dynamic range compensation for scanning electron microscope imaging system by average mid-point local recursive mean separate histogram equalization

A real-time local dynamic range compensation system for scanning electron microscope (SEM) imaging applications is studied in this paper. This improved method, average mid-point local recursive mean separate histogram equalization (AMPLRMSHE) uses conventional automatic brightness contrast range stability while providing a better 3D profile appearance. By using sub-block technique, the image's pixel intensity can be processed independently. Moreover, this proposed technique involved the use of average mid-point mean that is based on the average luminance intensity level. With this, it can help to remove the blocking effect. The proposed system utilizes the local histogram profiling technique and brings higher image compensation or 3D image profile.