MPC in high-speed atomic force microscopy

Model predictive control (MPC) is a multivariable control algorithm commonly used when tracking a reference trajectory is the primary goal. It minimizes the steady-state tracking error, increases the closed-loop bandwidth, and enables the controller to track a reference signal, the major requirements for nanopositioning applications. These capabilities motivated this research on improving the positioning performance of the piezoelectric tube scanner (PTS) in an atomic force microscope (AFM) to achieve better imaging at high scanning speed. This paper surveys the effectiveness of an MPC controller for AFM imaging by considering its different features and comparing its results with those obtained from the in-built proportional integral (PI) controller.