Probe compensated NF-FF transformation with planar wide-mesh scanning

Aim of this work is to extend the nonredundant sampling representations to the NF-FF transformation technique with plane-rectangular scanning. To this end, a two-dimensional OSI expansion, which allows the reconstruction of the NF data required by the classical NF-FF transformation [8] from the knowledge of those acquired by the proposed planar wide-mesh scanning (see Fig. 1), is developed. The use of the sampling representation and OSI expansion reduces in a remarkably way the NF data needed to reconstruct the far-field radiation pattern.