Double-layer BEM for generic electrostatics

This contribution has two main goals. First one is to highlight the superiority of the DLA (Double-Layer Approach) contrary to the conventional IEM (Integral Equation Method) for the analysis of the electrostatic problems. The second goal is to point out to the very frequent incorrect modeling approaches when applying electro-static analysis for the simulation tasks in the dielectric design. Both targets are elaborated using the comparison with standard SCM (Surface Charge Method) on several examples from academic and industrial praxis.