Aberration correction for transport of intensity phase imaging

Transport of intensity phase imaging suffers from phase aberration due to presence of noise in experimental data and aberration induced by optical system. This induced low frequency aberration corrupts the original phase and makes it difficult to use for any further quantitative processing. In this paper an aberration correction scheme is proposed. A polynomial model is used to represent the low frequency induced aberrations, and further subtracted from the corrupted phase for correcting the phase profile. The proposed scheme is implemented on experimental data obtained from a static microstructure phase object, of 100 nanometer height. The results obtained from the proposed scheme shows a good agreement with the actual known values.