A test methodology to screen scan-path failures

It is important to screen scan-path failures because scan-path failures affect product yield even though these are not related to the device functional operations. However, the additional efforts such as diagnosis are required to screen scan-path failures. In this paper, we propose a new test methodology to screen scan-path failures under the Automatic-Test-Pattern-Generation (ATPG) constraints and the multi-capture-clock condition without diagnosis. Experimental results show that the proposed methodology efficiently screens scan-path failures with high test coverage.