Abstract:
Bridge faults are important that cause a reliability concern. Since process variation affects the bridge faults, it should be considered for bridge fault analysis. This p...Show MoreMetadata
Abstract:
Bridge faults are important that cause a reliability concern. Since process variation affects the bridge faults, it should be considered for bridge fault analysis. This paper proposes a new analysis method for resistive bridge faults considering process variation. The proposed method analyzes defect coverage for resistive bridge faults by using circuit level modeling. The proposed method uses the lower level analysis and it reduces redundant test patterns for bridge test.
Published in: 2016 International SoC Design Conference (ISOCC)
Date of Conference: 23-26 October 2016
Date Added to IEEE Xplore: 29 December 2016
ISBN Information: