System identification using identification patterns

In this paper, system identification techniques using identification patterns are developed for use in on-line, in-situ monitoring of sensors and systems. The dynamic properties of sensors play an essential role in the performance of measurement and control systems. Both the single-frequency identification pattern (SIP) of the squarewave and the compact multifrequency identification pattern (MIP) for other test signals are examined at the output of a system. The dynamic behaviour can then be monitored using identification patterns, where the identification pattern area, as a simple time domain aid, is examined at the output in terms of system parameters.