Probabilistic analysis for low voltage ride through test data of doubly fed induction generators in China

An important aspect of research on integrating wind farms is the analysis of short circuit current contribution to the power grid. In this paper, the fault related features of doubly fed induction generators (DFIGs) are modeled using low voltage ride through (LVRT) test data sets. The dynamic behavior of DFIGs after fault occurrence is represented by a typical curve that is obtained using a curve clustering technique - the backward scenario reduction method. Then, two fault features (the maximum value of the short circuit current termed as peak current and the time to reach it), which are important for protection relay settings, are collected and analyzed using the probability density functions (PDFs). Two cases are considered in the analysis and some discussions are presented in the end.