Characterization of non-vertically aligned semiconductor nanowires by THz emission measurements

In this work terahertz (THz) pulse emission of the non-vertically aligned GaAs core-shell nanowires (NWs) is investigated. THz emission azimuthal dependencies of different NW samples have been measured. It is shown that these measurements together with theoretical calculations could be a very promising method to determine the effective index of refraction (n₀) of the NW ensemble. The measurement of azimuthal dependencies are confirmed to be a much more sensitive way for measuring n₀ than traditional THz TDS method.