Optical loss analysis of silicon solar cells using spatial resolved quantum efficiency and reflectance measurements

IQE data has long been a key analysis tool for c-Si cell research. Transitioning from single point measurements to spatially resolved measurements allows for the detailed analysis of quality and uniformity of the processes and materials used in cell manufacturing. This work explores how spatially resolved reflectance data can be analyzed to provide valuable information regarding the front surface texturing, rear surface properties, and ARC properties of completed solar cells.