CAD models of losses for slotline on multilayered dielectric substrates

This paper addresses an accurate CAD oriented integrated closed-form model for the computation of losses for planar and non-planar slotline on a finite-thickness multilayered dielectric substrates. The analysis of the structures has been done using conformal mapping and single layer reduction (SLR) technique. The validity of the proposed integrated model is tested over wide range of parameters: 1 GHz ≤ f ≤ 60 GHz, 0 μm ≤ t ≤ 50 μm, 2.2 ≤ ε_r ≤ 20 and 0.02 ≤ w/h ≤ 1.0 against the 3D-EM simulated results. The average deviation of the model against the comparison is 3.4%.