Detection of small dielectric inhomogeneities enclosed by random scatterers via Kirchhoff and subspace migration

Although Kirchhoff and subspace migration algorithms have been shown to be feasible for detecting various types of inhomogeneities, this has only been confirmed for cases where the inhomogeneities are located in a homogeneous medium. In this paper, we apply Kirchhoff and subspace migrations for the detection of small dielectric inhomogeneities enclosed by small randomly distributed dielectric scatterers. We present our numerical simulation results to examine the feasibility of the migrations and compare their detection performances.