A hybrid method for quantitative statistical analysis of in-situ IC and electronics in complex and wave-chaotic enclosures

This research concerns with a quantitative statistical characterization of IC and electronic systems in large complicated enclosures. The objective is to identify, quantify, predict and characterize the in-situ performance of IC electronics housed inside the enclosure of interest, such as a room, aircraft fuselage, or computer box. A novel hybrid deterministic and stochastic formulation is proposed, in which small electronic components (circuits, packages, PCBs, etc.) in the computational domain are modeled using first-principles and large portions (cavity enclosures) are modeled statistically. The capability and benefits of the computation algorithms are exploited, illustrated and validated through representative product-level IC and electronic systems.