Optimizing sweeping frequencies of microwave sensors using intelligent feature selection

In recent years, microwave testing of metallic and dielectric structures has been gaining an increasing interest both in the lab and in the field. Performing structural health testing in the field requires compact hand-held test equipment. However, reducing the circuit complexity might come at the cost of the inspection quality. This work presents utilization of intelligent feature section for selecting the top contributing frequencies to be used during the inspection process instead of sweeping over the entire sensors' operation ranges.