Semiconductor Integrated Electronics Susceptibility

Microelectronic Circuit Technology is sufficiently well developed to be incorporated in operational systems. I n anticipation of electromagnetic compatability problems, measurement techniques have been developed for the purpose of testing and evaluating small electronic units. Measurements have been made on several different types of miniaturized circuits with particular emphasis on integrated electronic circuits. Three levels of interference potential have been selected to indicate the relative rate of degradation for each component. The first level i s that for which the interfering signal i s barely detectable . The second level is that at which the function of the component is completely overshadowed by the interfering signa l . The third level is that at which an irreversable malfunction of the component occurs. These levels are specified in terms of magnitudes of fields to which the miniature components are subjected. A technique is described for measuring small volume fields thereby completing the RFI analysis procedure. in addition to typical miniaturized circuit susceptibilities, a description of the sources of specific problems is given and methods of reducing susceptibilities are discussed.