A Parallel-Strip Line for Testing RF Susceptibility

This paper presents a technique for establishing known, high intensity EP fields suitable for testing the susceptibility of electronic equipment to these fiel.ds. The technique overcomes a def1ciency in tests for radiated susceptibility wh1ch are required by military specifications, such as MIL-l.0266oo. Such tests fail to use field intensities that are representative of the environments in which electronic equipment will be installed. It is becoming more important not only to use realistic field strengths, but to know these field strengths to a fair degree of accuracy. 1'he system designer will have more assurance of system compatib1l1ty if components ba.ve been tested to meet the requirements of the installation environment. A significant amount of time and money can be saved if susceptibility problems are recognized and solved prior to equipment installation.