Chip physical failure analysis and diagnose method

Hardware trojan will modify the value of register and cause device degradation failure. Therefore, it is far-reaching significance issues for the hardware trojan detection methods and national security to study on logic circuit transmission characteristics and the chip degradation failure physical mechanism which is caused by hot carrier injection hardware trojans. In this paper, a ATLAS simulation devices were tested using hot carrier injection degradation (hot carrier degradation, HCD) stress model to the degradation failure process which caused by injecting the hot carrier hardware trojan (hot carrier injection hardware trojan, HCIHT) to the MOSFET device. Another normal MOSFET combined with a hot carrier injection hardware trojan MOSFET to the comprise the inverter logic circuit by using the ATLAS 2D device simulation system with SmartSpice instructions mixmode. The effect on logic circuit output characteristics caused by hot carrier injection hardware trojan is studied. It is also studied how the W/L value of a hardware trojan transistor influences the output characteristics of the logic circuit. The results indicated that the negative impact of hardware trojan on logic circuit DC current output characteristic is more obvious than AC transient time characteristic. Thus, we propose an effective method and a convenient procedure to detect the injection physical hardware trojan in packaged chips. Furthermore, the test process is a feasible operation method for detecting hot carrier injection hardware trojan.