An Improved Technique for Profile Reconstruction of PEC Bodies

This letter describes an improved technique for model-based profile reconstruction of perfect electric conductor (PEC) objects. The technique takes advantage of the fact that the illuminated part of the object-under-test (OUT) is, in general, accurately reconstructed when considering independent incident angles. The knowledge of the illuminated part is used to weight the reconstructed profile for each incidence. A comparison to the extended methodology that takes into account all the incident angles simultaneously is presented, proving that the proposed technique provides faster convergence to an accurate recovery of the OUT. Application examples considering one and two OUTs are presented.