A 3.9 ps RMS resolution time-to-digital converter using dual-sampling method on Kintex UltraScale FPGA

The principle of tapped-delay line (TDL) style field programmable gate array (FPGA)-based time-to-digital converters (TDC) requires finer delay granularity for higher time resolution. Given a tapped delay line constructed with carry chains in an FPGA, it is desirable to find a solution subdividing the intrinsic delay elements further, so that the TDC can achieve a time resolution beyond its cell delay. In this paper, after exploring the available logic resource in Xilinx Kintex UltraScale FPGA, we propose a dual-sampling method to have the TDL status sampled twice. The effect of the new method is equivalent to double the number of taps in the delay line, therefore a significant improvement in time resolution should present. Two TDC channels have been implemented in a Kintex UltraScale FPGA and the effectiveness of the new method is investigated. For fixed time intervals in the range from 0 to 440 ns, the average time resolutions measured by the two TDC channels are respectively 3.9 ps with the dual-sampling method and 5.8 ps by the conventional single-sampling method. In addition, the TDC design maintains advantages of multichannel capability and high measurement throughput in our previous design. Every part of TDC, including dual-sampling, code conversion and on-line calibration could run at 500 MHz clock frequency.