Improvement of the search method for parametric fault diagnosis of analog integrated circuits

The paper deals with local soft fault diagnosis of process parameters in analog CMOS circuits designed in nanometer technology. The main achievement of this work is improvement of the diagnostic method based on the idea of systematic searching for the solutions of a diagnostic equation along a space curve. The proposed modification speeds up the numerical tracing of this curve. In addition the method is adapted to diagnose integrated circuits with MOS transistors characterized by BSIM 4 model and concentrates on the oxide thickness defects. To illustrate the proposed approach two numerical examples are given.