Extrapolations using vectorial planar near-field measurements for EMC applications

This work presents a new method of extrapolating the far field from a planar scanning of the near field of a radiating structure. This extrapolation is possible using the relative complex voltage of a moving loop and the method of moments (MOM). Problems related to field disturbances caused by the near-field probe and complexity of modeling the radiating structure were solved. Using this method, it would be possible to make preliminary measurements on printed circuit boards (PCBs) prototypes, without having to use an open area test site (OATS), in order to assess their compliance with emission levels prescribed by regulatory agencies.