Characterization of >100 GHz devices using photoconductive pump and probe measurement

Summary form only given. The characterization of >100 GHz devices were demonstrated using the photoconductive pump and probe measurement without accompanying deembedding process. The devices include transmission line, open/short termination and filters. The close agreement of the measurement to the FDTD simulation verifies the reliability and the usefulness of the measurement at the millimeter wave region over 100 GHz.