A study on the properties of complementary frequency selective surfaces for permittivity measurements

This paper presents parametric studies on the geometric and electromagnetic (EM) properties of complementary frequency selective surfaces (CFSS), used in an X-band waveguide for measuring the permittivities of dielectric substrates. This gives understanding of the optimum configuration to be used for the dielectric measurements. The studies were done via simulations using 3D finite-difference timedomain (FDTD) EM software, Empire XPU™ and the results are summarized in this paper.