A thorough way of mapping efficiency with photoluminescence

An alternative method to map essential variables like dark saturation current density, series resistance, and the ultimate cell efficiency will be introduced. This approach will combine the terminally connected diode model with the ideality factor map technique modified to a scenario where current is extracted out of the circuitry. Following the delineation of the steps governing the principles of parameter mapping, we elaborate the fidelity that could be gained via improving upon the already existing methods.