Improved Tampering Localization in Digital Image Forensics Based on Maximal Entropy Random Walk

In this paper we propose to use maximal entropy random walk on a graph for tampering localization in digital image forensics. Our approach serves as an additional post-processing step after conventional sliding-window analysis with a forensic detector. Strong localization property of this random walk will highlight important regions and attenuate the background - even for noisy response maps. Our evaluation shows that the proposed method can significantly outperform both the commonly used threshold-based decision, and the recently proposed optimization-based approach with a Markovian prior.