Surface-plasmon enhanced microscopy using blocked silver nanodot arrays

Surface-plasmon enhanced microscopy has been investigated using blocked random nanodot arrays. J744 cells were imaged on blocked nanodot arrays under total internal reflection. The images were deconvolved based on localized near-field distribution for super-resolution. Experimentally achieved resolution is estimated to be 100-150 nm. Effects of signal-to-noise and registration on the reconstructed images are discussed.